Abstract
The pulsed laser deposition technique utilised to deposit SnSe thin films on quartz substrates utilises Nd:YAG laser at the temperature of 573 K with different substrate–target distances (Ds-t) of 2, 2.5, 3 and 3.5 cm. X-ray diffraction of the thin films revealed an orthorhombic phase with a polycrystalline structure. Crystallite size decreased when Ds-t increased. Field emission scanning electron microscopy showed the film morphology and revealed the formation of spherical and nanorod structures with increasing Ds-t. The energy band gap calculated from transmittance data increased in the range of 1.71–3.65 eV with increasing Ds-t. The absorption coefficient, refractive index, loss factor (loss tangent), extinction coefficient and optical conductivity were affected by Ds-t variation.
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