Abstract
The roll-over shape often observed in the current–voltage curve of Ag(In,Ga)Se2 (AIGS) solar cells degrades the open circuit voltage (VOC) and particularly the fill factor (FF). The origin of the roll-over shape was investigated by experimental measurements and device simulation. By combining AC Hall measurement and the peel-off process, we estimated the AIGS hole concentration to be 2.2 × 1012 cm−3. Theoretical simulation revealed that the roll-over shape is attributed to this low hole concentration. Under an applied forward bias, the band bending near the back contact of the AIGS layer forms an intrinsic semiconductor owing to the injected electrons, leading to the formation of an inverted diode. To solve this issue, the addition of NaF by the postdeposition treatment of the AIGS layer was performed. As a result, the hole concentration of the AIGS layer increased, significantly improving its VOC, FF, and conversion efficiency.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
