Impact of Reference-Layer Stray Field on the Write-Error Rate of Perpendicular Spin-Transfer-Torque Random-Access Memory

Abstract

A finite-temperature micromagnetic study of magnetization switching and write-error rates in a perpendicular magnetic tunnel junction with and without synthetic antiferromagnetic layer (SAF) is presented. In the absence of SAF, magnetization switching is induced by domain-wall nucleation and propagation. Although the various modes of domain-wall propagation are observed to delay switching, it does not show an appreciable impact on the overall write-error-rate slopes. In the presence of the nonuniform stray field from the SAF assembly, the domain-wall-based switching modes turn on more complex magnetization dynamics that impedes the switching process. In cases where the SAF layers fail to balance each other contributing to a stronger stray field, incoherent switching modes give rise to metastable states with significantly longer lifetimes, and a dramatic change in the write-error slopes is observed. Simulation results are compared to recent experimental findings from time-domain measurements of spin-transfer-torque switching and measurements of anomalous write-error rates. These results directly prove the long-predicted relation of the SAF stray field to write-error anomaly in perpendicular spin-transfer-torque magnetic random-access memory and could be useful to solve the anomalous write-error problems.