Abstract
Organic–inorganic perovskites photovoltaic materials are considered as one of the promising candidates for the emerging photovoltaic (PV) sector. It has drawn tremendous attention from fundamental research and PV industries, due to its high efficiency, chemical properties, and low fabrication cost. But, its lifetime under real field operation is always the major obstacle toward commercialization. Potential‐induced degradation (PID) is known as the common reliable threat in the established commercial PV technologies which lead to catastrophic failure within a short time. Thus, it is essential to enable reliability assessment of PID on the precommercial development stage of perovskite photovoltaics to further enrich the confidence by identifying, eliminating, and developing an understanding of the possible degradation mechanism in the field condition. In this article, different architecture‐based perovskite solar cells are studied to reveal the degradation mechanism under PID for the first time. The results show that PSCs of n–i–p with a phenyl C61 butyric acid methyl ester (PCBM) layer have good stability under PID compared with other treated structures with only 4% degradation after 18 h.
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