Abstract

the effect of recovery on Negative Bias Temperature Instability (NBTI) measurements had always been a challenge for reliability lifetime estimations. Currently various methods had been developed to suppress this characteristic but being able to completely remove it had been to no avail. This paper will first demonstrate the degree of impact of recovery on NBTI measurements; and then moving on to the influence of measurement system as well as testing time on NBTI lifetime estimation. Keywords-NBTI; recovery; reliability; device lifetime

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