Abstract
In this work we present the impact of the variations in lithography on the performance of analog circuits. Matching pairs of devices are critical in the design of many analog circuit blocks. Simple circuits, such as current mirrors and differential pairs, depend on the matching between transistors to provide accurate bias currents and symmetrical ac gains with minimal offsets. Complex analog systems, such as analog-to-digital converters and phase-locked loops, depend on the matching between different active and passive devices, such as transistors and resistors. Variations in lithography encountered during fabrication of analog circuits can lead to matching errors and hence performance and yield losses for the device. The impact of some lithographical errors, such as focus and dose errors, mask errors, and lens aberrations, on some of the key analog building blocks, namely a single transistor, a current mirror and a differential pair is presented. The errors of such cases are also explored for the ring oscillator, demonstrating the extent of performance variation on complex analog circuits.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.