Abstract
The effect of annealing the substrate on the structural and optical properties of the nickel oxide thin films containing a fixed ratio of molybdenum was investigated. Energydispersive X-ray spectroscopy (EDX) revealed that the Mo ratio is 4.41 wt%. X-ray diffraction (XRD) revealed that the formed films comprise a phase of NiO0.96. The average crystallite size, dislocation density, and strain function were calculated. Atomic force microscopy (AFM) was employed to investigate the morphology and surface roughness. With the increase in the substrate temperature from 298 K to 673 K, the optical band gap values varied from 3.72 eV to 3.58 eV.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
