Abstract

Objective: The principal aim of this investigation was to assess the impact of bismuth oxide on the optical properties, radiation shielding characteristics, and dielectric behavior of lead borosilicate glasses doped with titanium oxide at a low concentration. Method: We intended to utilize the conventional rapid melt quenching method to produce glasses with the following chemical composition: 25 PbO+ 15 B2O3 + 0.1 TiO2 + (59.9-x) SiO2 : x Bi2O3(0≤x≤12). Findings: XRD and SEM analyses were used to confirm the samples' non-crystalline properties, while DTA investigations were used to evaluate the samples' ability to form glass. The numerous structural elements were identified through the utilization of FT–IR and Raman analyses. The optical characteristics of glasses are determined by optical absorption studies. The findings derived from optical absorption spectral analyses revealed a progressive increase in the concentration of octahedral Ti4+ ions with the mol% Bi2O3 concentration. In order to analyse the glasses' dielectric properties, an impudence analyser was employed. The results obtained from these inquiries indicate that glasses do contain Bi2O3 at concentrations lower than 12 mol% experience a progressive increase in dielectric constant values. Further investigation is conducted into the radiation shielding properties of the glasses. Novelty: The findings indicate that the values of the glasses' optical band gap, radiation shielding ability, dielectric constant, and thermal stability are all directly correlated with their Bi2O3 concentration. Keywords: FT­IR, Raman, OBG, MAC, Activation Energy

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