Abstract
Impact of Back-Gate Radiation on Single-Event Effects of Ultrathin Body and Buried Oxide Fully Depleted Silicon-on-Insulator MOSFETs
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https://doi.org/10.1007/s11664-023-10680-8
Journal: Journal of Electronic Materials | Publication Date: Aug 30, 2023 |
Impact of Back-Gate Radiation on Single-Event Effects of Ultrathin Body and Buried Oxide Fully Depleted Silicon-on-Insulator MOSFETs
Join us for a 30 min session where you can share your feedback and ask us any queries you have