Abstract
Testing immunity on transient disturbances in main supply of information electronic equipments includes Electrostatic discharge immunity test, Electrical fast transient/burst immunity test, Surge immunity test and Voltage dips, Short interruptions and Voltage variations immunity tests. In this paper we performed theoretical analysis of the source, appearance mechanism and consequence of electrical fast transient/burst, and experimental work for Electrical fast transient/burst immunity test of electronic equipments. .
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