Abstract
This paper presents a comprehensive method for the integrated circuits (ICs) immunity characterization. The resistive RF injection probe (RFIP) method is used to study the immunity of an analog-to-digital converter (ADC) embedded in a microcontroller. The provided set of immunity parameters is then exploited to construct an immunity model of the ADC according to the Integrated Circuits Immunity Model-Conducted Immunity (ICIM-CI) model. Despite some limitations, measurement and modeling results show a good potential of this method for a better understanding of ICs immunity.
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