Abstract
ABSTRACTThe factors determining electrical characteristics using immittance data of heterogeneous systems are not identical to those established with devices based on single-crystal/single-junction (SCSJ) technology. The ”state of normalization” using ”physical geometrical factors” of the asmeasured immittance quantities does not provide a SCSJ-like straightforward interpretation of simultaneously operative phenomena. The normalization procedure can the vitiate identity of each phenomenon occurring within the series-parallel microstructural network of electrical paths. The advantage of using the as-measured immittance data in delineating simultaneously operative phenomena is emphasized. An approach to data-handling/analyzing is proposed considering the limitations and conditions of utilizing the as-measured immittance data. The ”state of normalization” using ”physical geometrical factors” can only be executed for a specific type of phenomenon when isolated from the total electrical behavior.
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