Abstract
The fast domain wall dynamics of amorphous glass-coated microwires can be changed drastically by properly selected annealing temperature. Here, the e ect of thermal annealing on the surface domain structure of microwires is examined. Imaging the surface domain structure by Bitter colloid revealed the periodic pattern in each studied sample. Thermal annealing of microwires results in the ve times increase of the domain wall velocity, as compared to the as-cast state. In uence of the surface domain structure on the fast domain wall propagation in microwires is discussed.
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