Abstract
We report a method to visualize individual potential-mediated defects in planar Droplet Interface Bilayers using Total Internal Reflection Fluorescence microscopy. Optical Single Channel Recordings of ionic flux across the bilayer enables us to characterize the gating of individual electropores. In contrast to typically noisy electrical recordings of electroporation, here we are able to resolve isolated freely diffusing pores. We examine the distribution of pore sizes and correlate this behavior with 2D diffusion. We also observe bilayer rupture events that result from expansion of a single pore.
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