Abstract
Anode-to-cathode spatially resolved study of polymer light-emitting device degradation has been performed based on a massive planar device structure. The unique device configuration of the extremely large planar frozen-junction light-emitting electrochemical cell allows for the study of device degradation by direct imaging. Constant current stress for an extended period results in a very unusual net luminance increase as opposed to luminance decay. Imaging of the emission zone has shown changes that are consistent with polymer degradation by the loss of electron mobility.
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