Imaging spectrometer for ultraviolet–near-infrared microspectroscopy

Abstract

We describe the design and performance of a new high-speed imaging spectrometer system developed for the spectral analysis of micrometer-sized features in transmitted light. The instrument utilizes the wavelength range from ultraviolet (UV) to near infrared (NIR) (250–975 nm). The extension into the ultraviolet range is to our knowledge unique. The system comprises two white light sources (xenon and halogen lamps), a motorized sample stage, microscope optics with slit-determined field of view, and three (UV, visible and NIR) parallel optical recording channels. The dispersive optical recording system is based on holographic gratings and uses charge-coupled-device (CCD) cameras as imaging detectors. The instrument has been fully integrated with data acquisition and control systems. Subsequent data analysis is performed by dedicated software. The instrument provides spectral images from narrow wavelength bands (5 nm). In such an image the spectral information from a selected wavelength band is depicted with its corresponding geometric location, i.e., a single pixel on the CCD chip. Hence, objects can be visualized in different wavelength bands and a spectrum can easily be produced for each location of the object. The instrument can measure objects up to 900 μm×27 mm with a spectral resolution better than 5 nm and a spatial resolution better than 5 μm. The imaging spectrometer system provides a powerful combination of spectroscopy and image processing for use in many applications in research, control and quality assessment, where spectral information and its location are of interest. Although the system has been primarily developed for applications in the pulp and paper industry, it has a vast potential for spectroscopic analysis with a micrometer spatial resolution in general and for measurements of impurities and their locations in products in particular. As an example of a measurement, spectral image data from a wood fiber are presented.