Abstract
ABSTRACTThe domains of antiferromagnetic order in elemental chromium can be observed with spatial resolution that is improved by orders of magnitude in comparison with previous techniques using magnetic x-ray scattering with an incident x-ray beam focused to a submicron spot. This use of magnetic x-ray microscopy takes advantage of the incommensurate spin density wave order in Cr to isolate magnetic scattering. The spin polarization dependence of the magnetic x-ray scattering cross section allows the first order spin-flip transition near 120 K to be imaged directly.
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