Abstract
Image inversion microscopy enables an increase of the lateral resolution of optical microscopes. A huge advantage of the method is the possibility to combine it with different illumination techniques, because the required image inversion interferometer has to be added behind the microscope objective.In this work, we investigate the influence of a pinhole on the resolution, the sectioning capability and the noise characteristics of a confocal fluorescence microscope combined with such an interferometer. Additionally, we demonstrate the benefits of image inversion interferometers for two-photon microscopes, as well as for extended-focus microscopes. As a result, the increase in information for interferometrically enhanced systems can be up to 500% in terms of the optical transfer function.
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