Imaging properties of a multi-reflection time-of-flight mass analyzer

Abstract

Ion-optical and imaging properties are characterized for a multi-reflecting time-of-flight (MR-TOF) analyzer based on planar ion mirrors and lenses. Mass and spatial resolutions are numerically evaluated for a 1.3 m long MR-TOF analyzer with 10 m flight path. A spatial resolution of a few microns is predicted for smaller (1–4 mm2) fields of view. For larger (100 mm2) fields of view the spatial resolution degrades to sub-mm, which still may be used for the simultaneous mapping of array ion sources. The aberration limit of the mass resolving power remains above Rm = 300 000 within 100 mm2 field of view and within 3% energy spread.