Abstract
Two apparatus have been developed for time-resolved measurements of x-ray diffraction patterns using an imaging plate detector. The first one is based on a cinema method which permits up to 40 exposures of a two-dimensional x-ray pattern (100×108 mm2) with a 0.3-s time resolution. The second one works as a 200-mm-long linear detector which enables a time resolution of 23 μs for a duration of up to 46 ms, based on a streak-camera method. These apparatus have no count rate limitation, a high detective quantum efficiency (more than 80% for 8–20 keV), a 1:105 dynamic range in x-ray intensity and a spatial resolution of 150 μm (FWHM) due to the performance of the imaging plate.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
