Abstract
A nontomography approach for the measurement of angular-dependent coherent-scatter cross section of x rays (E≃40-80 keV) is described. It is shown that an analyzer crystal, which is proposed to be used for the sampling of the cross section, simultaneously provides information about the location of the scattering volume inside the object. A numerical simulation demonstrates that this method can be applied for nondestructive analysis of an object's internal structure.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
