Abstract
A new technique to obtain a magnified image of a surface with a low-energy electron diffraction instrument with central electron gun is described. It is achieved by scanning the primary electron beam by means of two pairs of Helmholtz coils externally attached to the apparatus. The technique can be used to analyse selected grains of polycrystalline samples by both LEED and AES.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
