Abstract
We show theoretically that atomic resolution imaging of a polar surface can be achieved by using an atomic force microscope with a charged tip (CAFM). The image is obtained by analyzing the Coulomb interaction force between the charged tip and the polar surface, which not only displays striking contrasts between atoms of different charges but also exhibits a short-range exponential decay when increasing the tip–surface distance. Such a CAFM may be useful in imaging all polar surfaces with or without defects. It may also be applied to surfaces which are nonpolar but with significant charge transfer between different atoms due to surface reconstruction.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
