Imaging of laser–plasma x-ray emission with charge-injection devices

Abstract

This work details the method of obtaining time-integrated images of laser–plasma x-ray emission using charge-injection devices (CIDs), as has been demonstrated on the University of Rochester’s 60-beam UV OMEGA laser facility [T. R. Boehly et al., Opt. Commun. 133, 495 (1997)]. The CID has an architecture similar to a charge-coupled device. The differences make them more resistant to radiation damage and, therefore, more appropriate for some application in laser–plasma x-ray imaging. CID-recorded images have been obtained with x-ray pinhole cameras, x-ray microscopes, x-ray spectrometers, and monochromatic x-ray imaging systems. Simultaneous images obtained on these systems with calibrated x-ray film have enabled determination of the absolute detection efficiency of the CIDs in the energy range from 2 to 8 keV.