Abstract
Characterization of poly( p-oxybenzoate) (POBA) films epitaxially grown on mica and KBr single crystal substrates was performed by atomic force microscopy (AFM). For a thin POBA film sample prepared at 320°C on a mica substrate, oligomer domains were found in the vicinity of the nuclei, forming an interfacial layer between the mica crystal and the homogeneous POBA film. The AFM study further clarified the lateral crystal growth mechanism of POBA. On POBA films with a thickness ranging from 100 to 200 nm on mica KBr substrates, small lateral singular domains with dimensions of 50–100 nm composed the large orientation domains. The size of the singular domains increased with the POBA film thickness. On POBA films beyond 300 nm in thickness on mica and KBr substrates, orientation domains were singular domains, some of which were bounded by vicinal planes.
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