Imaging of charge collection properties of a CVD diamond detector using X-ray-induced current microscopy

Abstract

A 5.5-keV X-ray microprobe was used at the European Synchrotron Radiation Facility in Grenoble (France) to image the transport properties of a ‘detector grade’ polished CVD diamond sample. Qualitative results concerning the spatial distribution of the X-ray-induced current were obtained with a submicrometer spatial resolution. Particular attention has been paid to the dependence of the photoresponse on bias polarity. Interpretation of the photocurrent maps has been drawn on the basis of previous results obtained using the ion beam-induced charge collection (IBIC) technique. Priming effects and polarisation effects are reported and discussed.