Abstract
We report the successful imaging of flux vortices in single crystal MgB2 using transmission electron microscopy. The specimen was thinned to electron transparency (350nm thickness) by focussed ion beam milling. An artefact of the thinning process was the production of longitudinal thickness undulations of height 1–2nm in the sample which acted as pinning sites due to the energy required for the vortices to cross them. These had a profound effect on the patterns of vortex order observed which we examine here.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
