Abstract
Based on the developed methods of hysteretic interference, we produced the calculated dependences $$U\left( x \right)$$ of the electric voltage across a magnetic field transducer on the x-coordinate. A magnetic carrier with an arctangent characteristic was exposed to a series of one, two, three, four, five, and fifteen bipolar pulses of linear-inductor magnetic field. An algorithm is presented for the sequence of changes in the total intensity of the magnetic field pulses on the aluminum plate surface that ensures the same amplitude of hysteretic electric-voltage oscillations and allows one to obtain a linear difference dependence $$U\left( x \right)$$ for wedge-shaped and flat aluminum samples. The results obtained make it possible to improve the accuracy and efficiency of object thickness gaging and testing for thickness variation in the given directions, as well as for defects in the object.
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