Abstract
The magnetic microstructure in a Co/Pt multilayer has been imaged by magnetic force microscopy employing a novel tip structure. Magnetic tips have been fabricated by evaporating a thin film onto a single facet of the pyramidal tip of a silicon nitride cantilever. Nanolithographically defined elements have been used to simulate the micromagnetic structure of the tip and have been investigated by the Lorentz mode of electron microscopy. We demonstrate that stray fields from the Co/Pt multilayer can be sensed by the tip producing images of the magnetic microstructure with a fine structure on a scale of 30–40 nm.
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