Imaging characterization of carbon nanotube tips modified using a focused ion beam

Abstract

A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.