Abstract
Imaging and Characterizing Nanoscale Fluctuations in the Distribution of Dopant Atoms by Scanning Tunneling Microscopy
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https://doi.org/10.4028/www.scientific.net/ddf.230-232.111
Journal: Defect and Diffusion Forum | Publication Date: Nov 1, 2004 |
Imaging and Characterizing Nanoscale Fluctuations in the Distribution of Dopant Atoms by Scanning Tunneling Microscopy
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