Abstract
We achieved direct visualization of the piezoelectric potentials in a single bent ZnO microwire (MW) using focused synchrotron radiation (soft x-ray) scanning photoelectron spectro-microscopy. Using radial-line scan across the bent section of ZnO MW, the characteristic core-level shifts were directly related to the spatial distribution of piezoelectric potentials perpendicular to the ZnO polar direction. Using piezoelectric modeling in ZnO, we delineated the band structure distortion and carrier concentration change from tensile to compressed sides by combining the spatial resolved cathodoluminescence characteristics in an individual microwire. This spectro-microscopic technique allows imaging and identification of the electric-mechanical couplings in piezoelectric micro-/nano-wire systems.
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