Imaging and analysis of multidimensional atomically thin transition metal dichalcogenide layers on diatom frustules

Abstract

Diatom frustules can exhibit multiple unique properties owing to their multidimensional and hierarchical pore structures. Herein, we report on the growth of transition metal dichalcogenides (TMDCs) on diatom frustules using metal–organic chemical vapor deposition. Structural analysis results revealed the conformal growth of primarily monolayer TMDCs not only on the outer surface but also inside the pore structures. Characterization and imaging using photoluminescence and micro-Raman analyses revealed that the resulting structures exhibit high-quality and uniform monolayer MoS2 films on the diatom frustules throughout the complex morphologies. Furthermore, these atomically thin layers provided a uniform conducting path for electrons from the sample surface to ground during scanning electron microscopy operations. This feature can minimize the reduction and/or deformation of the signals obtained with a conventional conducting layer coating, thereby enabling imaging and analysis of the diatom frustules during energy-dispersive X-ray spectroscopy measurements and focused ion-beam processing.