Abstract
Conventional structured illumination microscopy (SIM) utilizes a sinusoidal excitation pattern of frequency within the detection passband and provides a maximum of twofold resolution enhancement over the diffraction limit. A transmission approach proposed in an earlier publication [J. Phys. D 53, 044006 (2019)JPAPBE0022-372710.1088/1361-6463/ab4e68] to further improve the lateral resolution requires sequential higher frequency illumination patterns. However, the existing reconstruction algorithms fail to deliver appropriate reconstruction when the excitation frequency lies far from the passband boundary. Here, we present a correlation-based SIM reconstruction approach for sequential high-frequency illumination patterns even if the pattern frequency lies far from the passband limit. The scheme can be suitably implemented in a variety of custom-built systems where illumination frequency lies beyond the passband support (e.g., non-linear SIM and plasmonic SIM).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
