Image reconstruction approach for a high space-bandwidth product structured illumination microscopy system

Abstract

Conventional structured illumination microscopy (SIM) utilizes a sinusoidal excitation pattern of frequency within the detection passband and provides a maximum of twofold resolution enhancement over the diffraction limit. A transmission approach proposed in an earlier publication [J. Phys. D 53, 044006 (2019)JPAPBE0022-372710.1088/1361-6463/ab4e68] to further improve the lateral resolution requires sequential higher frequency illumination patterns. However, the existing reconstruction algorithms fail to deliver appropriate reconstruction when the excitation frequency lies far from the passband boundary. Here, we present a correlation-based SIM reconstruction approach for sequential high-frequency illumination patterns even if the pattern frequency lies far from the passband limit. The scheme can be suitably implemented in a variety of custom-built systems where illumination frequency lies beyond the passband support (e.g., non-linear SIM and plasmonic SIM).