Abstract
SUMMARYA survey is made of a number of the localized signal selection methods and related techniques which may be used to improve the electron microscope image contrast from small regions of material and thereby bring the specimen resolution actually achieved somewhat closer to the electron‐optical resolution of present‐day instruments. Geometrical and stereo methods are discussed, as well as weak‐beam and other coherent elastic scattering methods. Localization effects in inelastic scattering and the image contrast in energy loss electrons are examined in greater detail.
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