Image analysis in physics–sensitivity analysis of morphological methods and their application in thin film physics

Abstract

In the contribution, several morphological algorithms for the description of spatial distribution of objects are analysed, the one-number features suggested and tested by means of computer experiment. A special attention was devoted to the description of system arrangement by means of Wigner-Seitz cells. It was found that for all morphological methods, it is possible to derive numerical features and some of them can be used in the study of thin film growth. The best features proved to be the features derived from radial distribution function and from areas of Wigner-Seitz cells.