IETCR: An Information Entropy Based Test Case Reduction Strategy for Mutation-Based Fault Localization

Abstract

Mutation-based fault localization (MBFL) is a recently proposed technique with the advantage of high fault localization accuracy. However, such a mutation analysis based technique is difficult to be accepted by industry due to its huge computational cost on mutation analysis. There are three ways to improve MBFL's efficiency, which are reducing the number of mutants, optimizing the mutants' execution process, and reducing the number of test cases. The former two ways have been mainly studied and shown promising results, but for the latter way, the related studies are limited since this kind of method will reduce the precision of MBFL. In this paper, we mainly focus on the latter way and propose an information entropy based test case reduction (IETCR) strategy for MBFL. In particular, we first calculate the entropy change of test cases and select a proportion of them according to their value. Then we use a reduced test suite to execute mutants. To show the effectiveness of the IETCR strategy, we choose six real-world programs with 112 faulty versions. In terms of mutation reduction rate, we find MBFL with the IETCR strategy can reduce 56.3%~88.3% cost while keeping almost the same fault localization accuracy when compared to the original MBFL without test case reduction. Moreover, we use Wilcoxon signed-rank test for statistical analysis, which shows that there is no statistically significant difference between MBFL with IETCR strategy and the original MBFL.