Abstract
Trace uncontrolled impurities as Ce3+, Cr3+, Eu3+ and Nd3+ were detected in YAlO3 and YAlO3: Cr crystals from their fluorescence by high sensitive photon counting detection. The concentrations of Ce, Cr, Eu, Nd and some other impurities (Tm, Ho, Mn, Mg, Fe) were also determined by electron beam excited X-ray microanalysis (abbr. EMA) in YAlO3 and Y3Al5O12 crystals (pure or doped). Both the methods (fluorescence detection and EMA) are compared, fluorescence properties of some trace impurities were determined and their influence on local distribution and transfer processes (Ce3+→Nd3+, Cr3+→ Nd3+) in these crystals are discussed.
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