Abstract
The aim of this paper is the identification of the thickness of a highlyconductive thin layer from boundary measurements. In the introduction,we propose an asymptotic model of the stiff transmission problem. Inthis context, the thickness of the thin layer appears to be a parameter ofthe boundary condition of a Ventcel equation. Our goal is to prove theidentifiability of this parameter from boundary measurements. After studying theregularity of the direct problem for non-smooth data, identifiability andweak stability results are proved by introducing a suitable admissibleparameter space. Numerical experiments are given to illustrate the results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
