Abstract
The atomistic structure of crystalline Ge–Sb–Te thin film for phase-change optical recording was investigated using transmission electron microscopy and nanobeam electron diffraction. Nonradial diffuse streaks were observed in electron diffraction patterns obtained from laser-induced crystalline phases of Ge–Sb–Te thin films. The intensities of the diffuse streaks were pronounced in particular directions in this alloy. The diffuse streaks were due to low-frequency transverse lattice waves that occur along directions perpendicular to the near neighbor zigzag atomic chains.
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