Identification of heavy metal pollutants in wheat by THz spectroscopy and deep support vector machine

Abstract

This paper proposes to detect heavy metal pollutants in wheat using terahertz spectroscopy and deep support vector machine (DSVM). Five heavy metal pollutants, arsenic, lead, mercury, chromium, and cadmium, were considered for detection in wheat samples. THz spectral data were pre-processed by wavelet denoising. DSVM was introduced to further enhance the accuracy of the SVM classification model. According to the relationship between the accuracy and the training time with the number of hidden layers ranging from 1 to 4, the model performs the best when the hidden layer network has three layers. Besides, using the back-propagation algorithm to optimize the entire DSVM network. Compared with Deep neural network (DNN) and SVM models, the comprehensive evaluation index of the proposed model optimized by DSVM has the highest accuracy of 91.3 %. It realized the exploration enhanced the classification accuracy of the heavy metal pollutants in wheat.