Abstract
In this work the BiVO4 ceramic matrix was prepared by the conventional solid-state reaction. The phase was calcined at 500°C, sintered at 800°C and characterized by X-ray Diffraction (XRD). The obtained phase presents a scheelite ABO4 structure. For this particular structure scanning electron microscopic analysis was performed. The dielectric properties were investigated in the temperature range from 220 to 460°C in radio-frequency (1Hz–1MHz). The sample display giant dielectric permittivity (ε′>2×106) behavior which might be relevant for future technological applications.
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