Abstract
Multiresolution analog-to-digital converters (MRADC) are usually used in Time Domain ElectroMagnetic Interference (TDEMI) measuring systems for very fast signal sampling with a sufficient dynamic range. The properties of the spectrum measured by the TDEMI system influenced by imperfections in the MRADC are analyzed in this paper. Errors are caused by imperfect matching of the offset and gain and phase of the circuits used in parallel input channels typical for the MRADC. For deep analyses of MRADC behavior, a precise mathematical model has been created using the concept of additive error pulses. Furthermore, a dedicated process of the identification of discrepancy parameters from experimental data is proposed. Identified parameters enter the expressions of the model and enable side to side comparison of experimental and theoretical results.
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