Identification and characterization of yeasts causing chalk mould defects on par-baked bread

Abstract

Pichia anomala, Hyphopichia burtonii and Saccharomycopsis fibuligera are spoilage yeasts causing chalk mould defects on par-baked breads packaged under modified atmosphere. The first objective of this study was to identify yeasts isolated from spoiled par-baked breads by means of a RAPD protocol and to determine the dominant spoilers amongst identified strains. The second objective was to determine the effects of water activity ( a w) and pH value on the growth rates and lag phase durations of P. anomala, H. burtonii and S. fibuligera. 95% of the yeasts tested were identified as P. anomala and 5% as S. fibuligera, H. burtonii was not detected. In order to investigate the effect of a w and pH the growth of the three yeasts was tested within an a w range of 0.88–0.98 and a pH range of 2.8–8.0. P. anomala was able to grow from pH 2.8 to 8 without a clear optimum. S. fibuligera and H. burtonii showed a pH optimum for growth of 5. The optimum water activity for growth was different for the three strains and varied between 0.96 and 0.98. These growth data were further used to develop secondary models that describe the relationship between a w and the radial or colony growth rate (g, mm/d) or the lag phase duration ( λ, d). The identification of the spoilage organisms and a good understanding of the effects of a w and pH on the growth behavior is essential for future development of adequate conservation strategies against chalk mould defects.