Abstract
This investigation is aimed towards using optical spectroscopy for remote identification and quantitative analysis of hazardous substances for safety and security applications. We introduce a new model employing portable photosensor devices that are based on the double-barrier and vertically placed silicon structure, for such applications. The different absorption depths of individual waves allow us to carry out their spectral selection using an algorithm developed for this specific objective. We tested the proposed model on experimental Ag-p-Si-n-Si structures. The algorithm is developed for the spectral analysis without the preliminary calibration. The low dark currents (several dozens of pA) permit us to carry out the spectral analysis of the integral flux of the electromagnetic radiation of low intensity. The quantitative data from light current-voltage characteristics allow us to obtain an intensity distribution spectrum characteristic of the material by using red LED and the green laser. The results of this investigation divulge new possibilities for the creation of a new type of the portable semiconductor spectrophotometer and due to its stand-off detection capability, offer potential pathways to evaluate hazardous substances.
Highlights
This investigation is aimed towards using optical spectroscopy for remote identification and quantitative analysis of hazardous substances for safety and security applications
We introduce a new model employing portable photosensor devices that are based on the double-barrier and vertically placed silicon structure, for such applications
With the help of Equation (13) and (14), the current-voltage characteristic data in the dark and under illumination, and the developed algorithm [21], we modelled the process of receiving of the spectral distribution of the radiation intensity
Summary
In recent years, increasing demand for the stand-off detection/sensing for hazardous chemical has significantly increased due to their use in safety, security, environmental protection and detect suspicious packages, wire, fragmentation. To optimize cost and to strategically place sensors in regions which are likely to provide a fair assessment of the contamination scenario, it is urgent to develop; a): inexpensive and small-size sensors with high spectral sensitivity, suitable for remote field identification, and, b): appropriate algorithms for accurate registration of data measured by these sensors. The spectrophotometric systems like this are not multi-purpose and require additional devices and external software support for the fulfillment of every new function. They are rather expensive and are not suitable for field deployment. The effective solution to the above-stated problems is by development of a semiconductor structure in which the electronic processes will provide high accuracy spectral analysis of the electromagnetic radiation. The present investigation offers a viable means of high level of accuracy during spectral analysis with the help of the electronic processes in n+-p-n+ structures
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