Abstract
As semiconductor wafer process technology went into nanotech level, IDDQ test faced tremendous challenges than it ever did due to high intrinsic leakage. A case study of IDDQ test in Availink ASICs in 130nm and 65nm process technologies demonstrates that IDDQ test is still feasible. The scheme includes IDDQ test vectors precise selection/generation, IDDQ measurement with high resolution/repeatability, proper statistical post processing algorithm in outlier detection, results verification, etc. As a result, IDDQ test is still considerable in manufacturing test strategy in nanotechnologies era.
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