IBM Small-Scale Superconducting Quantum Computer Not Gate Error Test

Abstract

Quantum NOT gates play an important role in the process of quantum information conversion. However, when the X-gate operation is executed on a real quantum computer, there is a large deviation between the actual operation result and the theory, which will lead to inaccurate results when the quantum algorithm containing the X-gate operation is executed. In order to facilitate users to understand the error fluctuations of the X gate in time before executing the quantum algorithm containing the X gate operation on the IBM quantum cloud platform, this paper proposes a method to measure the X gate error. By measuring the X-gate error of four small-scale superconducting quantum computers on the back end of the IBM quantum cloud platform, analyze the degree of fluctuation of the actual measurement value of the quantum device; at the same time, under different execution times shots, the influence of the X-gate test is analyzed. The test results show that the measured value of each qubit of different quantum devices fluctuates to different degrees; the execution times of shots are different, and the test results of X-gate error will be affected to different degrees. This test method helps users select the optimal performance of the qubits before executing quantum algorithms with X gate on IBM's small-scale quantum computers.