Abstract
The literature on the frequency versus temperature characteristics of quartz crystal resonators is reviewed. Three papers that deal with frequency versus pressure hysteresis are included, as these may possibly have relevance to frequency versus temperature hysteresis. It is seen that the causes of hysteresis are not well understood. The evidence to date is inconclusive. The mechanisms that can cause hysteresis include: strain changes changes in the quartz, contamination redistribution, oscillator circuitry hysteresis, and apparent hysteresis due to thermal gradients. The results to date seem to indicate that lattice defects are somehow related to thermal hysteresis. Stress relief in the mounting structure can also produce significant hysteresis. As crystal processing techniques have improved. contamination has become less of a problem.
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