Abstract
Low temperature environment affects the growth and yield of watermelon negatively. The conventional visual inspection with human eyes has a limitation for accurate phenotyping of the stress symptom. Spectral imaging technique has been used as a useful phenotyping tool for visualizing physiological responses of plants. In this study, responses of chilling stresses of watermelon leaves were investigated using Vis/NIR hyperspectral imaging (HSI) technique. Sensitive and resistant to chilling tolerance of watermelon plants were exposed to low temperature conditions. HSI of the treated leaves were collected and analyzed with multivariate analysis. The result shows that HSI technique could distinguish between susceptible and resistant plants.
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